首页> 外文OA文献 >Localization landscape theory of disorder in semiconductors I: Theory and modeling
【2h】

Localization landscape theory of disorder in semiconductors I: Theory and modeling

机译:半导体无序的局部化景观理论I:理论   和建模

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

We present here a model of carrier distribution and transport insemiconductor alloys accounting for quantum localization effects in disorderedmaterials. This model is based on the recent development of a mathematicaltheory of quantum localization which introduces for each type of carrier aspatial function called \emph{localization landscape}. These landscapes allowus to predict the localization regions of electron and hole quantum states,their corresponding energies, and the local densities of states. We show howthe various outputs of these landscapes can be directly implemented into adrift-diffusion model of carrier transport and into the calculation ofabsorption/emission transitions. This creates a new computational model whichaccounts for disorder localization effects while also capturing two majoreffects of quantum mechanics, namely the reduction of barrier height (tunnelingeffect), and the raising of energy ground states (quantum confinement effect),without having to solve the Schr\"odinger equation. Finally, this model isapplied to several one-dimensional structures such as single quantum wells,ordered and disordered superlattices, or multi-quantum wells, where comparisonswith exact Schr\"odinger calculations demonstrate the excellent accuracy of theapproximation provided by the landscape theory.
机译:我们在这里提出了一种载流子分布和传输半导体合金模型,该模型解释了无序材料中的量子定位效应。该模型基于量子定位数学理论的最新发展,该理论为每种类型的载流子空间函数引入了\ emph {localization landscape}。这些景观使我们能够预测电子和空穴量子态的定位区域,其相应的能量以及态的局部密度。我们展示了如何将这些景观的各种输出直接应用于载流子运输的漂移扩散模型以及吸收/发射跃迁的计算中。这创建了一个新的计算模型,该模型在解决无序局域效应的同时还捕获了量子力学的两个主要效应,即势垒高度的减小(隧道效应)和能量基态的升高(量子约束效应),而无需解决Schr \ “ odinger方程。最后,此模型适用于几个一维结构,例如单量子阱,有序和无序超晶格或多量子阱,其中与精确的Schr''odinger计算的比较证明了由景观提供的出色逼近精度理论。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号